Researchers invented a novel method to measure the permittivity of insulators 100 times more accurately than before. This technology is expected to contribute to the efficient development of sensitive ...
A new technical paper titled “Characterizing the Broadband RF Permittivity of 3D-Integrated Layers in a Glass Wafer Stack from 100 MHz to 30 GHz” was published by researchers at NIST. “We present a ...
JuanHinojosa obtained a Ph.D. degree (Doctorat d'Université)in electronics from the University of Lille, France, in 1995. Hisresearch activities have focused on the development of measurementbenches ...
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