To read more news from IMS 2006, see the links box in our main IMS story: “RF enables “mobile living room.” Suss MicroTec demonstrated its new |Z| RF probe card for production test as well as its new ...

The HR-E 40-1 passive near-field probe from Langer EMV-Technik measures electrical RF fields up to 40 GHz. Designed to be connected to a spectrum analyzer, oscilloscope, or similar device, the probe ...

It’s a problem that has dogged electronic engineers since the first electrons were coaxed along a wire: that measuring instruments can themselves disrupt the operation of a circuit. Older multimeters ...

Taking a swipe at the cost of ownership, two additions to the Pyramid parametric probe card family allow single-pass DC and RF measurements, promising to reduce the cost of parametric production test ...

The new P819 from Peak Test Services is a spring-contact probe specifically designed for contacting HSD (high-speed data) connectors in RF applications. The probe is equipped with a calyx spring for ...

The current stay-at-home, work-from-home situation challenges the semiconductor industry in a way we have never seen before. Social distancing and remote work put operational procedures in place that ...

It’s a problem that has dogged electronic engineers since the first electrons were coaxed along a wire: that measuring instruments can themselves disrupt the operation of a circuit. Older multimeters ...